TAIMAZ & ZEISS Co, have held the first workshop on Introduction of Zeiss Electron Microscopes and their application in Parsian Azadi Hotel on 15th January 2018. This workshop was held with the purpose of transferring the most cutting-edge innovations in this field to the managers and specialists of laboratories of Universities in Iran. This workshop started at 9:00 AM and finished at 5:00 PM and the audience got their certificates at the end of the workshop. The following topics have been reviewed in above mentioned workshop by international speakers:
• Introduction and Principles of Scanning Electron Microscopy
• ZEISS SEM Portfolio, its detection capabilities and applications behind
• ZEISS FESEM & FIB-SEM Portfolio, its detection capabilities and applications behind
• Features & In-situ investigation examples
• Bio EM applications & Correlative Microscopy Solutions
Scanning Electron Microscopes (SEM)
Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and deliver images with information about the samples’ topography and composition. CSEMs (conventional SEMs with a thermic electron source) and FE-SEMs (field emission SEMs with a field emission electron source) from Zeiss deliver high resolution surface information and superior materials contrast. Select your SEM out of a comprehensive portfolio of systems.
Your FE-SEMs with Gemini Optics and Sigma
Get high resolution images in excellent quality even from challenging samples, conveniently and fast – with Gemini technology. Gemini optics stands for more than 20 years of experience in field emission scanning electron microscopy (FESEM): when resolution is not enough without sufficient image quality you profit from Gemini optics, especially for beam sensitive samples.Experience enhanced Gemini technology with a new generation of FE-SEMs for research, industrial labs and imaging facilities.
ZEISS is introducing two FE-SEM families: the ZEISS GeminiSEM family and the ZEISS Sigma family.
