{"id":31476,"date":"2018-01-15T12:36:38","date_gmt":"2018-01-15T12:36:38","guid":{"rendered":"http:\/\/taimaz.com\/?p=31476\/"},"modified":"2024-05-22T11:18:28","modified_gmt":"2024-05-22T11:18:28","slug":"first-workshop-introduction-zeiss-electron-microscopes-2018","status":"publish","type":"post","link":"https:\/\/taimaz.com\/en\/first-workshop-introduction-zeiss-electron-microscopes-2018\/","title":{"rendered":"First workshop on Introduction of Zeiss Electron Microscopes – Tehran 2018"},"content":{"rendered":"

TAIMAZ<\/a> & ZEISS Co, have held the first workshop on Introduction of Zeiss Electron Microscopes<\/a> and their application in Parsian Azadi Hotel<\/a> on 15th January 2018. This workshop was held with the purpose of transferring the most cutting-edge innovations in this field to the managers and specialists of laboratories of Universities in Iran. This workshop started at 9:00 AM and finished at 5:00 PM and the audience got their certificates at the end of the workshop. The following topics have been reviewed in above mentioned workshop by international speakers:
\n\u2022 Introduction and Principles of Scanning Electron Microscopy
\n\u2022 ZEISS SEM Portfolio, its detection capabilities and applications behind
\n\u2022 ZEISS FESEM & FIB-SEM Portfolio, its detection capabilities and applications behind
\n\u2022 Features & In-situ investigation examples
\n\u2022 Bio EM applications & Correlative Microscopy Solutions<\/p>\n

Scanning Electron Microscopes (SEM)<\/strong><\/p>\n

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Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and deliver images with information about the samples\u2019 topography and composition. CSEMs (conventional SEMs with a thermic electron source) and FE-SEMs (field emission SEMs with a field emission electron source) from Zeiss deliver high resolution surface information and superior materials contrast. Select your SEM out of a comprehensive portfolio of systems.<\/p>\n

Your FE-SEMs with Gemini Optics and Sigma<\/strong><\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n

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Get high resolution images in excellent quality even from challenging samples, conveniently and fast – with Gemini technology. Gemini optics stands for more than 20 years of experience in field emission scanning electron microscopy (FESEM): when resolution is not enough without sufficient image quality you profit from Gemini optics, especially for beam sensitive samples.Experience enhanced Gemini technology with a new generation of FE-SEMs for research, industrial labs and imaging facilities.<\/p>\n

ZEISS is introducing two FE-SEM families: the ZEISS GeminiSEM family and the ZEISS Sigma family.<\/strong><\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n